當奈米探針工程師遇到新型原子力顯微鏡－新表面特性辨識技術

When a Nano-Probe Engineer Meet a New Type of AFM-a Novel Analysis Technology for Surface Property

高豐生(Feng-Sheng Kao) ； 朱仁佑(Jen-You Chu)

《科儀新知》 211期 (2017/06) Pp. 89-96

摘要

近年來新型原子力顯微鏡的普及，讓材料表面物理特性研究更加容易，可同時得到高解析的形貌、變形量、軟硬度、黏性等資訊。本團隊除了使用既有的AFM功能之外，利用修飾技術製作特殊AFM探針，除了可判斷表面微區的親疏水性、也可以鑑定生物分子間作用力，並以汙染物探針鑑定抗汙效能。並量測不同超軟物質的楊氏模數，對於開發生醫材料領域有實質的幫助。本團隊也開發不沾黏的AFM探針，改善黏性高分子影像掃描的問題。所開發出的新技術期望在未來可以協助並縮短新材料開發時間，落實應用到先進的工業技術領域。

並列摘要

The new type of atomic force microscopy is becoming more prevalent. The powerful functions make it easier to study physical properties of surfaces. Some information such as elastic modulus, deformation, and adhesion can be obtained at the same time without compromising highest resolution. In this study, mechanic property measurement of soft matter is conducive to biomaterials development. By modifying AFM tips with functional groups, the recognition of specific surface properties is achieved, that is molecular recognition force microscopy. Our laboratory had developed several functional tips which can distinguish hydrophilic or hydrophobic surfaces, antifouling efficacy and so on. In this study we provide a method for determining the antifouling ability of a material surface, which is based on AFM with pollutant-coated AFM probes. We also improve the anti-stick property of AFM probe and extend probe's life time, which solves the stickiness problems when scanning polymer samples. We expect this technology can significantly shorten the time of developing new materials for the manufacture and speed the implementation of the novel technology in industry.