透過您的圖書館登入
IP:3.12.164.254
  • 期刊

New Self-dual Circuits for Error Detection and Testing

摘要


In this paper new methods for the transformation of a given combinational circuit into a self-dual circuit based on the notion of a self-dual complement are investigated. The large variety of self-dual complements can be utilized to optimize the transformed self-dual circuit. Self-dual duplication and self-dual parity prediction are considered in detail. As a method for the reduction of self-dual outputs, output space compaction of self-dual outputs is considered. For the first time we also describe in this paper how a self-dual circuit can be modified into a self-dual fault-secure circuit.

延伸閱讀