In this study, by controlling the temperatures of the source powder side and of the substrate side in bath furnace, α-HgI2 polycrystalline films are prepared by physical vapor deposition. The surface morphology and the degree of crystallinity of the as-grown α-HgI2 polycrystalline films are characterized by scanning electron microscopy and X-ray diffraction, respectively. For electrical properties, resistivity and dielectric constant measurements by Precision Component Analyzer. Furthermore, thermally stimulated current measurements are performed to reveal the characters of deep-trapping levels.