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光學非接觸式三次元掃描量測探頭之研製

The Implementation of an Optical Noncontact Coordinate Measurement Scanning Probe

摘要


本研究提出一套光學非接觸式三次元掃描量測探頭的設計法則及其校正方式,以 0.06 mm/pixel 之解析度為目標,設計及製造出一組以線雷射光束與雙CCD結合而成的光學探頭,利用標準試片及次像素點解析技巧,快速且精確的建立空間座標與CCD像平面問的對映函數關係,使用CNC工具機為量測機台進行三維物體非接觸式掃描量測,再利用B-Spline的擬合方式,對單CCD或雙CCD掃描量測的數據做結合與平滑化處理,使之成為一組完整的輪廓量測資料,可提供作電腦輔助設計與製造使用。

並列摘要


In this study, a novel approach to the design rules and calibration methods of an optical non-contact scanning probe system is proposed and verified by experiments. The optical probe consists of a line laser diode and two CCD (Charge-Coupled Device) cameras and is placed on a machining center to measure the workpiece profiles. For the systematic calibration and profile measurement, a mapping function method is presented. This method provides a simple and accurate calculation to the relationship between the real space plane and its related image plane on CCD camera. A negative film with known regular grid is used to construct the mapping function and the space coordinate of an object can be obtained from its image in a CCD camera via the mapping function. The measured profile data are smoothed by the B-Spline blending function and can be transfer to a CAD/CAM package for industrial applications.

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