鑑別染色原理在掃描探針顯微技術上的應用

Application of Chemical Staining Method in Scanning Probe Microscopy

謝明峰(Ming-Feng Hsieh) ； 林登松(Deng-Sung Lin)

《科儀新知》 146期 (2005/06) Pp. 18-24

https://doi.org/10.29662/IT.200506.0002

摘要

由於掃描探針顯微鏡的快速發展，清楚地看到一顆顆的原子並非難事。但是在晶體或薄膜表面上含有多種不同原子的複雜系統中，要能判別影像上每個原子種類就常常很困難。而首先提出將微生物學中常使用於光學顯微鏡搭配染色技術來進行觀測的方法應用在掃描探針顯微鏡上，將選用的適當原子當作染劑，成功地使影像上不同種類原子顯現對比，解決一些複雜表面的物理機制問題。我們相信這種「鑑別染色」原理確實可以被廣泛應用於所有的掃描探針顯微技術上。

並列摘要

Since the various kind of scanning probe microscopes (SPM) were invented during the last three decades, seeing individual atoms has become routine work in many laboratories. On many complex surfaces on crystals and thin films consisting more than one kind of atoms, however, it has been proven to be extremely difficult to distinguish different atoms, if not impossible. Our research group has introduced into the scanning tunneling microscopy the use of the chemical staining method widely used in optical microscopy of microbiology. We have succeeded resolving the Si and Ge atoms in the Si/Ge surfaces. This concept of staining method should be also very useful for any type of scanning probe microscopes.