為了增強光檢測二極體在紫外/藍光區域間的響應度,本研究使用p-ZnO/n-Si之異質結構的感光二極體,使用超音波噴霧熱解法以氮-銦共同摻雜出p-type之氧化鋅薄膜,將它沉積在(100)方向之矽基板。在逆向偏壓1伏特其光電流為 安培,暗電流為 安培;由此可看出光電流與暗電流相差了兩個級數的大小。在氧化鋅與矽之間製作一層薄氧化層,製作P-N與P-O-N兩種結構之元件。當入射光為530 nm,外加逆向偏壓為1伏特,P-N結構之響應度與量子效率分別為0.204 A/W 、47.73%,入射光為850 nm,光響應度與量子效率分別為0.209 A/W 、30.49%;當入射光為410 nm,外加逆向偏壓為1伏特,P-O-N結構之響應度與量子效率分別為0.225 A/W 、68.05%,入射光為530 nm,光響應度與量子效率分別為0.252 A/W 、58.96%,入射光為850 nm,光響應度與量子效率分別為0.297 A/W 、43.33%。
ZnO ultraviolet (UV)/visible photodiodes were fabricated. The N-In codoped p-type ZnO films were deposited on (100)-oriented silicon substrate by ultrasonic spraying pyrolysis method. It was found the photocurrent approximately 3.9×10-7 A at a bias of 1 V and a photocurrent to dark current contrast ratio higher than around two orders of magnitude. The P-N structure photodiodes exhibited two higher responsive regions denoted as A and B, respectively. In the region A, the values of responsivity and QE at 530 nm at biases of 1 V were 0.204 A/W and 47.73%, respectively. In the region B, the values of responsivity and QE at 850 nm at biases of 1 V were 0.3135 A/W and 45.73%, respectively. The P-O-N structure photodiodes exhibited two higher responsive regions denoted as C, D and E, respectively. In the region C, the values of responsivity and QE at 410 nm at biases of 1 V were 0.225 A/W and 68.05%, respectively. In the region D, the values of responsivity and QE at 530 nm at biases of 1 V were 0.252 A/W and 58.96%, respectively. In the region E, the values of responsivity and QE at 850 nm at biases of 1 V were 0.297 A/W and 43.33%, respectively.