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  • 學位論文

高分子薄膜之磨潤特性研究

Tribology properties of polymer film

指導教授 : 廖培凱

摘要


現今的科技由於奈米技術的蓬勃發展,使得薄膜製程更多元化,用途也更廣泛,不僅在金屬材料方面,甚至高分子材料也有廣泛應用。所謂的奈米材料,一般而言,所謂的奈米是一種尺度的度量單位(1nm=10-9m),1nm大約是我們頭髮直徑的1/5000【1】,而在量測奈米尺度方面,科技的發達讓量測儀器也有很多種類,例如原子力顯微鏡(AFM)、掃描探針顯微鏡(SPM)、場效電子顯微鏡(FEM)、掃描穿隧顯微鏡(STM)....等,這些都跟以往的傳統材料量測方式有很大的不同,也因為這樣我們才能滿足我們所需要的尺度量測。而在奈米尺度下,會發生微米尺寸下所沒有的問題,所以奈米技術對於新材料的設計和結構的了解,具有十分重要的價值。 本研究針對高分子材料的薄膜性質加以探討,所進行之實驗共使用三種不同單體PF、MEH、DB高分子材料,各具三種不同厚度之薄膜,膜厚大約為幾十nm至幾百nm。經由奈米壓痕和奈米刮痕測試,從所獲得的數據,嘗試建立一理論模型來分析高分子薄膜之機械性質。由測試結果及理論模型,可知參數γ與材料種類有關,而模型中之指數係數m則隨薄膜厚度而異。 希望能經由本研究所建構之理論模型,能更廣泛運用在其他高分子材料薄膜之性能研究。

並列摘要


With great advancement (achievements) of nanotechnology, thin-film fabrication process becomes more and more versatile as well as the applications, not only in metal but also in the field of high-polymers. As we know, nanometer is the measurement in length which is defined by 1nm=10-9m , about 1/5000 of the diameter of our hair [1]. Owing to the development in science and technology, there are many devices and instruments for the measurement in nano-scale. For example Atomic Force Microscope (AFM)、Scanning Probe Microscope (SPM)、Field Emission electron Microscope (FEM)、Scanning Tunneling Microscope (STM) and so on. These are all very different comparing with traditional methods and instruments. Only with these new and different instruments, our measuring requirements can be satisfied. Under nano-scale, new problems that never encountered under micro-scale will occur here. Therefore, the understanding of the design and structure for new material under nano-scale is extremely important. This research is to study the thin-film properties of high-polymer material. Three different monomers (PF, MEH and DB) are tested, with three different film thicknesses about several dozen to several hundred nano meters. Nano-indentation tests and nano-scratch tests were conducted in this research. Attempts were made to establish a theoretical model to analyze the mechanical property the thin-film of high polymers. From the experimental results and theoretical analysis, it is concluded that parameter γ is related to the category of material, while the index m in the model is related to the thickness of the thin-film. It would be very beneficial that the theoretical model established through this research could be more widely applied to other researches on thin films of polymer materials.

參考文獻


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被引用紀錄


蔡宗嶧(2009)。高分子薄膜機械性質模型於不同刮痕試驗負載率下之研究〔碩士論文,崑山科技大學〕。華藝線上圖書館。https://www.airitilibrary.com/Article/Detail?DocID=U0025-1307200910244100
蘇奕仁(2009)。高分子薄膜機械性質模型之膜厚因素探討〔碩士論文,崑山科技大學〕。華藝線上圖書館。https://www.airitilibrary.com/Article/Detail?DocID=U0025-2708200914503500

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